TEST_NAME : Wafer
TEST_DATE : 24_08_27-17_52_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-010-010-06 | FUSED_ID : 6359364768387604646
  IC_TEMP :  -56.65 | VDDM : 1118.69 | AUX_INT :   -7.24 | CsaBias :   75.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.51961e-04 / 2
  ADC_P0  : -7.23837e-03 ± 1.97326e-02
  ADC_P1  : 8.28732e-03 ± 4.79489e-04
  ADC_P2  : -5.78875e-06 ± 2.30606e-06
  CSA_Chi2/NDF : 1.25303e-04 / 2
  CSA_P0  : 5.97552e-02 ± 7.46625e-03
  CSA_P1  : 9.78261e-03 ± 5.62528e-04
  CSA_P2  : -4.73469e-05 ± 8.56664e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [59, 93, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [0, 35, 36, 60, 62, 68, 115, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2965', '1.800', '0.1530', '1.799', '0.0908', '7.000', '0.7067', 1, 1, 1, 1, 1724773973.7182863]
VI_after__Init : ['1.201', '0.2966', '1.800', '0.1530', '1.800', '0.0852', '7.000', '0.7069', 1, 1, 1, 1, 1724773981.7946491]
VI_at__the_End : ['1.201', '0.4829', '1.800', '0.1368', '1.800', '0.1137', '7.000', '0.7073', 1, 1, 1, 1, 1724774049.3565657]