TEST_NAME : Wafer
TEST_DATE : 24_08_27-17_56_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-010-012-06 | FUSED_ID : 6359364768387604678
  IC_TEMP :  -54.96 | VDDM : 1125.09 | AUX_INT :   -8.96 | CsaBias :   66.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35103e-03 / 2
  ADC_P0  : -8.96141e-03 ± 2.48867e-02
  ADC_P1  : 8.44978e-03 ± 6.08852e-04
  ADC_P2  : -6.22203e-06 ± 2.95522e-06
  CSA_Chi2/NDF : 1.31334e-04 / 2
  CSA_P0  : 5.97242e-02 ± 7.64382e-03
  CSA_P1  : 1.00577e-02 ± 5.75906e-04
  CSA_P2  : -5.15285e-05 ± 8.77037e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [34, 39, 90, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [63, 73, 78, 105, 108, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2833', '1.800', '0.1559', '1.800', '0.0915', '7.000', '0.7069', 1, 1, 1, 1, 1724774165.0827153]
VI_after__Init : ['1.201', '0.2834', '1.800', '0.1561', '1.800', '0.0860', '7.000', '0.7071', 1, 1, 1, 1, 1724774173.8271616]
VI_at__the_End : ['1.201', '0.4829', '1.800', '0.1338', '1.803', '0.1156', '7.000', '0.7076', 1, 1, 1, 1, 1724774233.7473896]