TEST_NAME : Wafer
TEST_DATE : 24_08_27-17_57_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-010-013-06 | FUSED_ID : 6359364768387604694
  IC_TEMP :  -56.32 | VDDM : 1123.01 | AUX_INT :   -7.50 | CsaBias :   59.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.88232e-04 / 2
  ADC_P0  : -7.50034e-03 ± 2.12986e-02
  ADC_P1  : 8.45127e-03 ± 5.34850e-04
  ADC_P2  : -5.49121e-06 ± 2.66461e-06
  CSA_Chi2/NDF : 1.49510e-04 / 2
  CSA_P0  : 6.11737e-02 ± 8.15562e-03
  CSA_P1  : 1.02090e-02 ± 6.14467e-04
  CSA_P2  : -5.37006e-05 ± 9.35761e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [18, 33, 44, 86, 91, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3368', '1.800', '0.1697', '1.800', '0.0970', '7.000', '0.7071', 1, 1, 1, 1, 1724774261.510313]
VI_after__Init : ['1.201', '0.3369', '1.800', '0.1698', '1.800', '0.0919', '7.000', '0.7069', 1, 1, 1, 1, 1724774269.5446208]
VI_at__the_End : ['1.201', '0.4868', '1.800', '0.1378', '1.799', '0.1135', '7.000', '0.7076', 1, 1, 1, 1, 1724774337.2586708]