TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_53_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.1
  ASIC_ID : XA-000-09-004-014-011-007-11 | FUSED_ID : 6359364768387608699
  IC_TEMP :  405.00 | VDDM :  979.48 | AUX_INT :  864.21 | CsaBias :  979.48
  CONF_FAIL_REG : 2324
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.51421e-01 / 2
  ADC_P0  : -2.33999e+01 ± 3.24977e+01
  ADC_P1  : 2.00811e-01 ± 2.91647e-01
  ADC_P2  : -4.12570e-04 ± 6.46317e-04
  CSA_Chi2/NDF : 2.05331e-03 / 2
  CSA_P0  : 6.91533e-02 ± 3.02239e-02
  CSA_P1  : 8.46715e-04 ± 2.27715e-03
  CSA_P2  : 6.06456e-06 ± 3.46783e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [33, 101, 106, 120, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [6, 14, 43, 47, 53, 58, 88, 94, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3030', '1.800', '0.1919', '1.696', '0.1500', '7.000', '0.7074', 1, 1, 1, 1, 1724777612.4123893]
VI_after__Init : ['1.201', '0.3032', '1.800', '0.1975', '1.697', '0.1500', '7.000', '0.7069', 1, 1, 1, 1, 1724777620.4567964]
VI_at__the_End : ['1.202', '0.1436', '1.800', '0.1661', '1.715', '0.1501', '7.000', '0.7076', 1, 1, 1, 1, 1724777686.8908849]