TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_47_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-011-011-11 | FUSED_ID : 6359364768387608763
  IC_TEMP :  -60.41 | VDDM : 1126.90 | AUX_INT :   -6.53 | CsaBias :   68.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.18012e-04 / 2
  ADC_P0  : -6.53046e-03 ± 1.93565e-02
  ADC_P1  : 8.39218e-03 ± 4.82793e-04
  ADC_P2  : -5.57330e-06 ± 2.38033e-06
  CSA_Chi2/NDF : 1.32679e-04 / 2
  CSA_P0  : 5.99847e-02 ± 7.68287e-03
  CSA_P1  : 1.02245e-02 ± 5.78849e-04
  CSA_P2  : -5.44581e-05 ± 8.81518e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [14, 19, 32, 43, 48, 49, 55, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [39, 63, 68, 72, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3267', '1.800', '0.1445', '1.799', '0.0974', '7.000', '0.7069', 1, 1, 1, 1, 1724777229.4907308]
VI_after__Init : ['1.201', '0.3267', '1.800', '0.1444', '1.801', '0.0915', '7.000', '0.7070', 1, 1, 1, 1, 1724777237.6501336]
VI_at__the_End : ['1.201', '0.4815', '1.800', '0.1401', '1.801', '0.1141', '7.000', '0.7076', 1, 1, 1, 1, 1724777299.9125679]