TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_43_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-011-013-11 | FUSED_ID : 6359364768387608795
  IC_TEMP :  -53.14 | VDDM : 1109.53 | AUX_INT :   -9.62 | CsaBias :   60.26
  CONF_FAIL_REG : 64
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43965e-03 / 2
  ADC_P0  : -9.62462e-03 ± 2.57044e-02
  ADC_P1  : 8.78654e-03 ± 6.56485e-04
  ADC_P2  : -6.37419e-06 ± 3.34253e-06
  CSA_Chi2/NDF : 1.48506e-04 / 2
  CSA_P0  : 6.38744e-02 ± 8.12820e-03
  CSA_P1  : 1.09014e-02 ± 6.12401e-04
  CSA_P2  : -6.30730e-05 ± 9.32615e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [10, 12, 43, 49, 85]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [25, 37, 47, 80, 89, 94, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4803', '1.800', '0.1627', '1.800', '0.0975', '7.000', '0.7069', 1, 1, 1, 1, 1724777037.6327133]
VI_after__Init : ['1.201', '0.4810', '1.800', '0.1627', '1.800', '0.0917', '7.000', '0.7069', 1, 1, 1, 1, 1724777045.709001]
VI_at__the_End : ['1.202', '0.4960', '1.800', '0.1641', '1.799', '0.1178', '7.000', '0.7077', 1, 1, 1, 1, 1724777112.45418]