TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_42_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-011-014-11 | FUSED_ID : 6359364768387608811
  IC_TEMP :  -54.35 | VDDM : 1125.42 | AUX_INT :  -11.13 | CsaBias :   80.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.94188e-03 / 2
  ADC_P0  : -1.11293e-02 ± 2.98889e-02
  ADC_P1  : 8.43972e-03 ± 7.25933e-04
  ADC_P2  : -6.04579e-06 ± 3.52428e-06
  CSA_Chi2/NDF : 1.36038e-04 / 2
  CSA_P0  : 5.78713e-02 ± 7.77952e-03
  CSA_P1  : 9.99046e-03 ± 5.86131e-04
  CSA_P2  : -5.01839e-05 ± 8.92608e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [0, 19, 25, 72, 96, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [17, 20, 62, 117, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2861', '1.800', '0.1473', '1.800', '0.0916', '7.000', '0.7069', 1, 1, 1, 1, 1724776941.6313653]
VI_after__Init : ['1.201', '0.2861', '1.800', '0.1473', '1.800', '0.0859', '7.000', '0.7067', 1, 1, 1, 1, 1724776949.9699311]
VI_at__the_End : ['1.201', '0.4810', '1.800', '0.1368', '1.800', '0.1121', '7.000', '0.7076', 1, 1, 1, 1, 1724777018.222046]