TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_40_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-011-015-11 | FUSED_ID : 6359364768387608827
  IC_TEMP :  -54.88 | VDDM : 1133.55 | AUX_INT :   -8.50 | CsaBias :   74.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28857e-03 / 2
  ADC_P0  : -8.49501e-03 ± 2.43230e-02
  ADC_P1  : 8.40742e-03 ± 5.98281e-04
  ADC_P2  : -5.88121e-06 ± 2.91751e-06
  CSA_Chi2/NDF : 1.26799e-04 / 2
  CSA_P0  : 5.98290e-02 ± 7.51071e-03
  CSA_P1  : 9.94942e-03 ± 5.65878e-04
  CSA_P2  : -4.93450e-05 ± 8.61765e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [2, 9, 16, 48, 62, 78, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [22, 23, 60, 83]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3087', '1.800', '0.1987', '1.800', '0.0934', '7.000', '0.7077', 1, 1, 1, 1, 1724776845.5891514]
VI_after__Init : ['1.201', '0.3089', '1.800', '0.1988', '1.799', '0.0863', '7.000', '0.7069', 1, 1, 1, 1, 1724776854.451578]
VI_at__the_End : ['1.201', '0.4899', '1.800', '0.1384', '1.800', '0.1129', '7.000', '0.7075', 1, 1, 1, 1, 1724776923.4976485]