TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_35_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-011-018-12 | FUSED_ID : 6359364768387608876
  IC_TEMP :  -64.10 | VDDM : 1127.28 | AUX_INT :   -8.72 | CsaBias :   59.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15414e-03 / 2
  ADC_P0  : -8.72359e-03 ± 2.29817e-02
  ADC_P1  : 8.54998e-03 ± 5.70751e-04
  ADC_P2  : -6.21354e-06 ± 2.81645e-06
  CSA_Chi2/NDF : 1.70766e-04 / 2
  CSA_P0  : 5.82272e-02 ± 8.71612e-03
  CSA_P1  : 1.06551e-02 ± 6.56697e-04
  CSA_P2  : -6.31408e-05 ± 1.00007e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [16, 25, 46, 69, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [9, 38, 45, 73, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2307', '1.800', '0.1558', '1.800', '0.0866', '7.000', '0.7068', 1, 1, 1, 1, 1724776558.1098385]
VI_after__Init : ['1.201', '0.2306', '1.800', '0.1558', '1.800', '0.0809', '7.000', '0.7069', 1, 1, 1, 1, 1724776566.9341698]
VI_at__the_End : ['1.201', '0.4739', '1.800', '0.1350', '1.799', '0.1156', '7.000', '0.7076', 1, 1, 1, 1, 1724776634.2369173]