TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_34_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-011-019-12 | FUSED_ID : 6359364768387608892
  IC_TEMP :  -56.22 | VDDM : 1126.46 | AUX_INT :   -7.35 | CsaBias :   73.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.50310e-04 / 2
  ADC_P0  : -7.34559e-03 ± 2.08871e-02
  ADC_P1  : 8.12392e-03 ± 5.05999e-04
  ADC_P2  : -4.94528e-06 ± 2.43205e-06
  CSA_Chi2/NDF : 1.31826e-04 / 2
  CSA_P0  : 5.92770e-02 ± 7.65813e-03
  CSA_P1  : 1.02807e-02 ± 5.76985e-04
  CSA_P2  : -5.42461e-05 ± 8.78680e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [10, 42, 72, 75, 80, 93, 104, 117, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [6, 28, 62, 76, 86, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2517', '1.800', '0.1369', '1.800', '0.0954', '7.000', '0.7077', 1, 1, 1, 1, 1724776462.5102115]
VI_after__Init : ['1.202', '0.2517', '1.800', '0.1368', '1.799', '0.0878', '7.000', '0.7068', 1, 1, 1, 1, 1724776471.282529]
VI_at__the_End : ['1.200', '0.4843', '1.800', '0.1378', '1.800', '0.1149', '7.000', '0.7074', 1, 1, 1, 1, 1724776536.6264539]