TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_26_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-011-024-12 | FUSED_ID : 6359364768387608972
  IC_TEMP :  -59.97 | VDDM : 1119.27 | AUX_INT :   -7.39 | CsaBias :   73.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.58775e-04 / 2
  ADC_P0  : -7.38689e-03 ± 1.98053e-02
  ADC_P1  : 8.14480e-03 ± 4.71628e-04
  ADC_P2  : -5.65200e-06 ± 2.22391e-06
  CSA_Chi2/NDF : 1.55850e-04 / 2
  CSA_P0  : 5.67232e-02 ± 8.32677e-03
  CSA_P1  : 1.00404e-02 ± 6.27362e-04
  CSA_P2  : -5.09120e-05 ± 9.55398e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [2, 27, 41, 63, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [31, 36, 83, 86, 100, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2336', '1.800', '0.1860', '1.800', '0.0881', '7.000', '0.7065', 1, 1, 1, 1, 1724775984.0989869]
VI_after__Init : ['1.201', '0.2336', '1.799', '0.1860', '1.800', '0.0828', '7.000', '0.7068', 1, 1, 1, 1, 1724775992.8331923]
VI_at__the_End : ['1.201', '0.4843', '1.800', '0.1366', '1.801', '0.1162', '7.000', '0.7077', 1, 1, 1, 1, 1724776060.598963]