TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_24_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-011-025-12 | FUSED_ID : 6359364768387608988
  IC_TEMP :  -56.67 | VDDM : 1126.29 | AUX_INT :   -7.39 | CsaBias :   78.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.51679e-04 / 2
  ADC_P0  : -7.38994e-03 ± 2.08457e-02
  ADC_P1  : 8.65719e-03 ± 5.23425e-04
  ADC_P2  : -6.73759e-06 ± 2.59454e-06
  CSA_Chi2/NDF : 1.41988e-04 / 2
  CSA_P0  : 5.82680e-02 ± 7.94781e-03
  CSA_P1  : 9.77428e-03 ± 5.98810e-04
  CSA_P2  : -4.55912e-05 ± 9.11917e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [31, 48, 64, 70, 74, 94, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [19, 23, 49, 60, 101, 104, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4620', '1.800', '0.1532', '1.800', '0.1027', '7.000', '0.7079', 1, 1, 1, 1, 1724775888.4911768]
VI_after__Init : ['1.201', '0.4621', '1.800', '0.1535', '1.800', '0.0942', '7.000', '0.7066', 1, 1, 1, 1, 1724775897.3765862]
VI_at__the_End : ['1.201', '0.4912', '1.800', '0.1362', '1.799', '0.1139', '7.000', '0.7073', 1, 1, 1, 1, 1724775964.7144384]