TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_23_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-011-026-12 | FUSED_ID : 6359364768387609004
  IC_TEMP :  -57.35 | VDDM : 1121.55 | AUX_INT :   -8.03 | CsaBias :   60.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.77497e-04 / 2
  ADC_P0  : -8.02529e-03 ± 2.11168e-02
  ADC_P1  : 8.68034e-03 ± 5.29013e-04
  ADC_P2  : -6.77660e-06 ± 2.62457e-06
  CSA_Chi2/NDF : 1.24422e-04 / 2
  CSA_P0  : 6.14941e-02 ± 7.43997e-03
  CSA_P1  : 9.77773e-03 ± 5.60548e-04
  CSA_P2  : -4.61180e-05 ± 8.53648e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [20, 67, 70, 79, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [12, 25, 52, 87, 98, 107, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3252', '1.800', '0.1647', '1.800', '0.0959', '7.000', '0.7070', 1, 1, 1, 1, 1724775792.3936846]
VI_after__Init : ['1.201', '0.3254', '1.800', '0.1648', '1.800', '0.0900', '7.000', '0.7069', 1, 1, 1, 1, 1724775800.443082]
VI_at__the_End : ['1.201', '0.4897', '1.800', '0.1372', '1.801', '0.1147', '7.000', '0.7076', 1, 1, 1, 1, 1724775857.1666238]