TEST_NAME : Wafer
TEST_DATE : 24_08_27-19_10_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x3 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-012-007-03 | FUSED_ID : 6359364768387612787
  IC_TEMP :  -54.90 | VDDM : 1130.74 | AUX_INT :  -10.48 | CsaBias :   74.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.81831e-03 / 2
  ADC_P0  : -1.04754e-02 ± 2.89636e-02
  ADC_P1  : 8.51790e-03 ± 7.24479e-04
  ADC_P2  : -5.45247e-06 ± 3.62770e-06
  CSA_Chi2/NDF : 1.54753e-04 / 2
  CSA_P0  : 5.91559e-02 ± 8.29740e-03
  CSA_P1  : 1.02367e-02 ± 6.25150e-04
  CSA_P2  : -5.31072e-05 ± 9.52029e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [26, 34, 39, 54, 89, 99, 119, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [62, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3355', '1.800', '0.1614', '1.799', '0.0943', '7.000', '0.7076', 1, 1, 1, 1, 1724778654.1970322]
VI_after__Init : ['1.201', '0.3372', '1.800', '0.1613', '1.802', '0.0866', '7.000', '0.7067', 1, 1, 1, 1, 1724778662.2793949]
VI_at__the_End : ['1.200', '0.4915', '1.800', '0.1387', '1.806', '0.1105', '7.000', '0.7073', 1, 1, 1, 1, 1724778726.7425058]