TEST_NAME : Wafer
TEST_DATE : 24_08_27-20_11_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-013-009-14 | FUSED_ID : 6359364768387616926
  IC_TEMP :  -55.57 | VDDM : 1129.24 | AUX_INT :   -8.09 | CsaBias :   81.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12205e-03 / 2
  ADC_P0  : -8.08695e-03 ± 2.27198e-02
  ADC_P1  : 8.16639e-03 ± 5.54049e-04
  ADC_P2  : -4.79002e-06 ± 2.69022e-06
  CSA_Chi2/NDF : 1.31184e-04 / 2
  CSA_P0  : 5.93839e-02 ± 7.63947e-03
  CSA_P1  : 9.98821e-03 ± 5.75579e-04
  CSA_P2  : -4.89270e-05 ± 8.76539e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [7, 25, 38, 49, 84, 92, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [8, 32, 38, 79, 89, 97, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2843', '1.800', '0.1957', '1.800', '0.0962', '7.000', '0.7069', 1, 1, 1, 1, 1724782295.683888]
VI_after__Init : ['1.201', '0.2844', '1.800', '0.1958', '1.800', '0.0909', '7.000', '0.7069', 1, 1, 1, 1, 1724782303.7523534]
VI_at__the_End : ['1.201', '0.4928', '1.800', '0.1391', '1.800', '0.1139', '7.000', '0.7076', 1, 1, 1, 1, 1724782371.1979866]