TEST_NAME : Wafer
TEST_DATE : 24_08_27-20_08_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-013-011-14 | FUSED_ID : 6359364768387616958
  IC_TEMP :  -50.26 | VDDM : 1131.13 | AUX_INT :   -6.81 | CsaBias :   89.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09988e-03 / 2
  ADC_P0  : -6.81429e-03 ± 2.25138e-02
  ADC_P1  : 8.11153e-03 ± 5.51284e-04
  ADC_P2  : -4.69015e-06 ± 2.67144e-06
  CSA_Chi2/NDF : 1.10351e-04 / 2
  CSA_P0  : 6.12881e-02 ± 7.00666e-03
  CSA_P1  : 9.54357e-03 ± 5.27901e-04
  CSA_P2  : -4.13834e-05 ± 8.03931e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [51, 65, 73, 84, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [12, 25, 35, 98, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3454', '1.800', '0.1786', '1.800', '0.0931', '7.000', '0.7073', 1, 1, 1, 1, 1724782102.5291533]
VI_after__Init : ['1.201', '0.3452', '1.800', '0.1787', '1.800', '0.0856', '7.000', '0.7068', 1, 1, 1, 1, 1724782111.342464]
VI_at__the_End : ['1.201', '0.4946', '1.800', '0.1392', '1.800', '0.1105', '7.000', '0.7074', 1, 1, 1, 1, 1724782180.419013]