TEST_NAME : Wafer
TEST_DATE : 24_08_27-22_22_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x3 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-017-011-08 | FUSED_ID : 6359364768387633336
  IC_TEMP :  -51.68 | VDDM : 1128.56 | AUX_INT : -104.32 | CsaBias :   -7.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22570e-03 / 2
  ADC_P0  : -1.04325e-01 ± 2.87754e-02
  ADC_P1  : 9.73264e-03 ± 6.93104e-04
  ADC_P2  : -9.78713e-06 ± 3.28790e-06
  CSA_Chi2/NDF : 1.75911e-04 / 2
  CSA_P0  : 6.27708e-02 ± 8.84644e-03
  CSA_P1  : 1.03038e-02 ± 6.66515e-04
  CSA_P2  : -5.23833e-05 ± 1.01502e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [30, 34, 70, 83, 90, 106, 114, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [1, 4, 15, 21, 39, 45, 51]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3850', '1.800', '0.1162', '1.800', '0.0898', '7.000', '0.7064', 1, 1, 1, 1, 1724790128.1900735]
VI_after__Init : ['1.201', '0.3849', '1.800', '0.1161', '1.801', '0.0850', '7.000', '0.7063', 1, 1, 1, 1, 1724790136.350478]
VI_at__the_End : ['1.201', '0.5015', '1.800', '0.1429', '1.805', '0.1115', '7.000', '0.7074', 1, 1, 1, 1, 1724790196.0089314]