TEST_NAME : Wafer
TEST_DATE : 24_08_27-22_17_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-017-014-08 | FUSED_ID : 6359364768387633384
  IC_TEMP :  -47.84 | VDDM : 1127.71 | AUX_INT :   -7.64 | CsaBias :   79.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10845e-03 / 2
  ADC_P0  : -7.64490e-03 ± 2.25833e-02
  ADC_P1  : 8.00981e-03 ± 5.40788e-04
  ADC_P2  : -4.69173e-06 ± 2.57162e-06
  CSA_Chi2/NDF : 1.31783e-04 / 2
  CSA_P0  : 5.98759e-02 ± 7.65687e-03
  CSA_P1  : 1.00822e-02 ± 5.76890e-04
  CSA_P2  : -4.64388e-05 ± 8.78535e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [3, 13, 18, 53, 79]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [0, 18, 81, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2326', '1.800', '0.1502', '1.800', '0.0835', '7.000', '0.7076', 1, 1, 1, 1, 1724789841.1888304]
VI_after__Init : ['1.201', '0.2326', '1.800', '0.1503', '1.800', '0.0764', '7.000', '0.7064', 1, 1, 1, 1, 1724789849.2912517]
VI_at__the_End : ['1.201', '0.5045', '1.800', '0.1397', '1.803', '0.1100', '7.000', '0.7075', 1, 1, 1, 1, 1724789917.6610396]