TEST_NAME : Wafer
TEST_DATE : 24_08_27-22_09_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-017-019-15 | FUSED_ID : 6359364768387633471
  IC_TEMP :  -51.59 | VDDM : 1125.91 | AUX_INT :   -8.30 | CsaBias :   87.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18479e-03 / 2
  ADC_P0  : -8.29964e-03 ± 2.33311e-02
  ADC_P1  : 8.06316e-03 ± 5.55756e-04
  ADC_P2  : -5.08075e-06 ± 2.63085e-06
  CSA_Chi2/NDF : 1.05688e-04 / 2
  CSA_P0  : 5.82814e-02 ± 6.85702e-03
  CSA_P1  : 9.64878e-03 ± 5.16627e-04
  CSA_P2  : -3.97938e-05 ± 7.86762e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [12, 14, 46, 102, 121, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [22, 49, 60, 67, 74, 98, 99, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3553', '1.800', '0.1637', '1.800', '0.0908', '7.000', '0.7068', 1, 1, 1, 1, 1724789361.2229092]
VI_after__Init : ['1.201', '0.3553', '1.800', '0.1635', '1.801', '0.0850', '7.000', '0.7065', 1, 1, 1, 1, 1724789369.3203797]
VI_at__the_End : ['1.201', '0.5047', '1.800', '0.1394', '1.804', '0.1093', '7.000', '0.7074', 1, 1, 1, 1, 1724789438.6952033]