TEST_NAME : Wafer
TEST_DATE : 24_08_27-22_07_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-017-020-15 | FUSED_ID : 6359364768387633487
  IC_TEMP :  -53.64 | VDDM : 1139.46 | AUX_INT : -205.57 | CsaBias :  -68.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38174e-03 / 2
  ADC_P0  : -2.05572e-01 ± 3.62189e-02
  ADC_P1  : 1.07642e-02 ± 7.93495e-04
  ADC_P2  : -1.42488e-05 ± 3.42603e-06
  CSA_Chi2/NDF : 1.31453e-04 / 2
  CSA_P0  : 5.82795e-02 ± 7.64729e-03
  CSA_P1  : 1.00469e-02 ± 5.76168e-04
  CSA_P2  : -4.66106e-05 ± 8.77436e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [1, 6, 10, 33, 45, 106, 107, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [16, 24, 65, 67, 82, 112, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4672', '1.800', '0.1365', '1.800', '0.0975', '7.000', '0.7067', 1, 1, 1, 1, 1724789266.000943]
VI_after__Init : ['1.201', '0.4652', '1.800', '0.1363', '1.800', '0.0929', '7.000', '0.7065', 1, 1, 1, 1, 1724789273.967386]
VI_at__the_End : ['1.201', '0.5024', '1.800', '0.1345', '1.799', '0.1114', '7.000', '0.7076', 1, 1, 1, 1, 1724789335.5398748]