TEST_NAME : Wafer
TEST_DATE : 24_08_28-18_42_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.1
  ASIC_ID : XA-000-09-004-015-002-010-02 | FUSED_ID : 6359364768388620450
  IC_TEMP :  357.00 | VDDM :    0.00 | AUX_INT :    0.00 | CsaBias :    0.00
  CONF_FAIL_REG : 4369
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 0.00000e+00 / 2
  ADC_P0  : 0.00000e+00 ± 0.00000e+00
  ADC_P1  : 0.00000e+00 ± 0.00000e+00
  ADC_P2  : 0.00000e+00 ± 0.00000e+00
  CSA_Chi2/NDF : 6.34358e-09 / 2
  CSA_P0  : 1.50986e-01 ± 5.31238e-05
  CSA_P1  : 2.32659e-06 ± 4.00250e-06
  CSA_P2  : -2.66279e-08 ± 6.09533e-08
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  
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VI_before_Init : ['1.201', '0.1502', '1.800', '0.1339', '1.798', '0.1498', '7.000', '0.7076', 1, 1, 1, 1, 1724863326.0299945]
VI_after__Init : ['1.201', '0.1505', '1.800', '0.1344', '1.799', '0.1486', '7.000', '0.7073', 1, 1, 1, 1, 1724863334.231479]
VI_at__the_End : ['1.201', '0.1506', '1.800', '0.1336', '1.800', '0.1505', '7.000', '0.7080', 1, 1, 1, 1, 1724863394.4189353]