TEST_NAME : Wafer
TEST_DATE : 24_08_28-18_54_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-002-013-02 | FUSED_ID : 6359364768388620498
  IC_TEMP :  -65.05 | VDDM : 1123.94 | AUX_INT :   -8.82 | CsaBias :   63.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21903e-03 / 2
  ADC_P0  : -8.82107e-03 ± 2.36242e-02
  ADC_P1  : 9.08923e-03 ± 6.22235e-04
  ADC_P2  : -7.12918e-06 ± 3.25485e-06
  CSA_Chi2/NDF : 1.81181e-04 / 2
  CSA_P0  : 5.69442e-02 ± 8.97797e-03
  CSA_P1  : 1.04911e-02 ± 6.76425e-04
  CSA_P2  : -6.19360e-05 ± 1.03012e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [12, 30, 123, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [7, 24, 25, 94, 102, 104, 122, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3150', '1.800', '0.1243', '1.800', '0.0929', '7.000', '0.7071', 1, 1, 1, 1, 1724864085.1164846]
VI_after__Init : ['1.201', '0.3156', '1.800', '0.1243', '1.799', '0.0870', '7.000', '0.7067', 1, 1, 1, 1, 1724864093.2420266]
VI_at__the_End : ['1.201', '0.4674', '1.800', '0.1357', '1.803', '0.1153', '7.000', '0.7079', 1, 1, 1, 1, 1724864150.5946553]