TEST_NAME : Wafer
TEST_DATE : 24_08_28-18_56_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-002-014-02 | FUSED_ID : 6359364768388620514
  IC_TEMP :  -65.17 | VDDM : 1070.89 | AUX_INT :   -9.78 | CsaBias :   42.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45565e-03 / 2
  ADC_P0  : -9.78422e-03 ± 2.58554e-02
  ADC_P1  : 8.77227e-03 ± 6.62578e-04
  ADC_P2  : -6.07472e-06 ± 3.39338e-06
  CSA_Chi2/NDF : 1.18383e-04 / 2
  CSA_P0  : 5.81162e-02 ± 7.25716e-03
  CSA_P1  : 1.06224e-02 ± 5.46774e-04
  CSA_P2  : -7.56976e-05 ± 8.32673e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [20, 33, 58, 76, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [2, 12, 32, 77, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4196', '1.800', '0.1733', '1.799', '0.0956', '7.000', '0.7073', 1, 1, 1, 1, 1724864181.397293]
VI_after__Init : ['1.201', '0.4204', '1.800', '0.1735', '1.800', '0.0898', '7.000', '0.7069', 1, 1, 1, 1, 1724864189.4056613]
VI_at__the_End : ['1.201', '0.4234', '1.800', '0.1350', '1.804', '0.1165', '7.000', '0.7076', 1, 1, 1, 1, 1724864244.6223764]