TEST_NAME : Wafer
TEST_DATE : 24_08_28-18_59_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-002-016-05 | FUSED_ID : 6359364768388620549
  IC_TEMP :  -57.69 | VDDM : 1132.18 | AUX_INT :   -8.20 | CsaBias :   52.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08827e-03 / 2
  ADC_P0  : -8.19908e-03 ± 2.23485e-02
  ADC_P1  : 8.65462e-03 ± 5.72015e-04
  ADC_P2  : -5.77933e-06 ± 2.91270e-06
  CSA_Chi2/NDF : 1.78535e-04 / 2
  CSA_P0  : 5.76459e-02 ± 8.91218e-03
  CSA_P1  : 9.99280e-03 ± 6.71469e-04
  CSA_P2  : -5.16992e-05 ± 1.02257e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [21, 44, 45, 51, 73, 99, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [8, 32, 73, 81, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3509', '1.800', '0.1155', '1.800', '0.0944', '7.000', '0.7072', 1, 1, 1, 1, 1724864373.8756902]
VI_after__Init : ['1.201', '0.3512', '1.800', '0.1156', '1.799', '0.0886', '7.000', '0.7072', 1, 1, 1, 1, 1724864381.8489797]
VI_at__the_End : ['1.201', '0.4759', '1.800', '0.1352', '1.802', '0.1122', '7.000', '0.7076', 1, 1, 1, 1, 1724864437.8857152]