TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_02_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-002-018-05 | FUSED_ID : 6359364768388620581
  IC_TEMP :  -58.99 | VDDM : 1122.60 | AUX_INT :   -8.36 | CsaBias :   76.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23799e-03 / 2
  ADC_P0  : -8.36445e-03 ± 2.38569e-02
  ADC_P1  : 8.53296e-03 ± 6.01181e-04
  ADC_P2  : -5.70974e-06 ± 3.00936e-06
  CSA_Chi2/NDF : 1.48162e-04 / 2
  CSA_P0  : 5.82476e-02 ± 8.11877e-03
  CSA_P1  : 1.03239e-02 ± 6.11691e-04
  CSA_P2  : -5.55582e-05 ± 9.31533e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [47, 77, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [38, 50, 56, 88, 89, 98, 101, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2622', '1.800', '0.1356', '1.800', '0.0827', '7.000', '0.7068', 1, 1, 1, 1, 1724864565.935899]
VI_after__Init : ['1.201', '0.2623', '1.800', '0.1356', '1.799', '0.0772', '7.000', '0.7069', 1, 1, 1, 1, 1724864574.2983246]
VI_at__the_End : ['1.201', '0.4863', '1.800', '0.1377', '1.806', '0.1114', '7.000', '0.7078', 1, 1, 1, 1, 1724864637.3584409]