TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_04_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-002-019-05 | FUSED_ID : 6359364768388620597
  IC_TEMP :  -68.31 | VDDM : 1118.77 | AUX_INT :   -8.42 | CsaBias :   53.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14378e-03 / 2
  ADC_P0  : -8.42251e-03 ± 2.28938e-02
  ADC_P1  : 8.87206e-03 ± 5.93335e-04
  ADC_P2  : -6.57784e-06 ± 3.05287e-06
  CSA_Chi2/NDF : 2.90575e-04 / 2
  CSA_P0  : 5.83930e-02 ± 1.13698e-02
  CSA_P1  : 1.06358e-02 ± 8.56630e-04
  CSA_P2  : -6.49086e-05 ± 1.30455e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [31, 57, 79, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [24, 60, 82, 103, 104, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1477', '1.800', '0.1838', '1.800', '0.0875', '7.000', '0.7072', 1, 1, 1, 1, 1724864661.4616647]
VI_after__Init : ['1.201', '0.1478', '1.800', '0.1839', '1.800', '0.0817', '7.000', '0.7069', 1, 1, 1, 1, 1724864670.0590105]
VI_at__the_End : ['1.201', '0.4728', '1.800', '0.1364', '1.800', '0.1167', '7.000', '0.7076', 1, 1, 1, 1, 1724864728.4045434]