TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_26_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-003-009-15 | FUSED_ID : 6359364768388624543
  IC_TEMP :  -60.64 | VDDM : 1121.26 | AUX_INT :   -8.06 | CsaBias :   69.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09713e-03 / 2
  ADC_P0  : -8.06218e-03 ± 2.24319e-02
  ADC_P1  : 8.67042e-03 ± 5.72195e-04
  ADC_P2  : -6.08261e-06 ± 2.89665e-06
  CSA_Chi2/NDF : 2.49949e-04 / 2
  CSA_P0  : 5.78672e-02 ± 1.05450e-02
  CSA_P1  : 1.03501e-02 ± 7.94492e-04
  CSA_P2  : -5.74872e-05 ± 1.20992e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [49, 52, 57, 73]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [26, 27, 28, 29, 52, 107, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4577', '1.800', '0.1402', '1.800', '0.0984', '7.000', '0.7072', 1, 1, 1, 1, 1724866006.5469892]
VI_after__Init : ['1.201', '0.4588', '1.800', '0.1405', '1.800', '0.0926', '7.000', '0.7072', 1, 1, 1, 1, 1724866015.3954072]
VI_at__the_End : ['1.201', '0.4820', '1.800', '0.1370', '1.800', '0.1162', '7.000', '0.7082', 1, 1, 1, 1, 1724866069.4731085]