TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_21_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-003-012-15 | FUSED_ID : 6359364768388624591
  IC_TEMP :  -57.37 | VDDM : 1123.37 | AUX_INT :   -7.51 | CsaBias :   72.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11407e-03 / 2
  ADC_P0  : -7.51133e-03 ± 2.26337e-02
  ADC_P1  : 8.01979e-03 ± 5.40255e-04
  ADC_P2  : -4.93960e-06 ± 2.55507e-06
  CSA_Chi2/NDF : 1.26265e-04 / 2
  CSA_P0  : 5.76856e-02 ± 7.49487e-03
  CSA_P1  : 9.21564e-03 ± 5.64684e-04
  CSA_P2  : -4.32430e-05 ± 8.59947e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [2, 8, 12, 42, 50, 70, 71, 78, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [37, 56, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4441', '1.800', '0.1588', '1.800', '0.1016', '7.000', '0.7068', 1, 1, 1, 1, 1724865718.701052]
VI_after__Init : ['1.201', '0.4451', '1.800', '0.1592', '1.800', '0.0956', '7.000', '0.7068', 1, 1, 1, 1, 1724865726.7805808]
VI_at__the_End : ['1.201', '0.4641', '1.800', '0.1310', '1.800', '0.1143', '7.000', '0.7076', 1, 1, 1, 1, 1724865782.8262973]