TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_18_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-003-014-15 | FUSED_ID : 6359364768388624623
  IC_TEMP :  -59.24 | VDDM : 1126.75 | AUX_INT :   -9.69 | CsaBias :   66.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41553e-03 / 2
  ADC_P0  : -9.68805e-03 ± 2.54625e-02
  ADC_P1  : 8.48022e-03 ± 6.21542e-04
  ADC_P2  : -6.31900e-06 ± 3.01939e-06
  CSA_Chi2/NDF : 1.75800e-04 / 2
  CSA_P0  : 5.91088e-02 ± 8.84366e-03
  CSA_P1  : 1.00027e-02 ± 6.66306e-04
  CSA_P2  : -5.34991e-05 ± 1.01471e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [5, 23, 35, 74, 79, 91, 105, 106, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [0, 16, 19, 66, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2199', '1.800', '0.1332', '1.800', '0.0855', '7.000', '0.7069', 1, 1, 1, 1, 1724865526.0680034]
VI_after__Init : ['1.201', '0.2200', '1.800', '0.1332', '1.800', '0.0796', '7.000', '0.7067', 1, 1, 1, 1, 1724865534.2862751]
VI_at__the_End : ['1.201', '0.4724', '1.800', '0.1354', '1.800', '0.1128', '7.000', '0.7073', 1, 1, 1, 1, 1724865596.7205791]