TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_17_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-003-015-15 | FUSED_ID : 6359364768388624639
  IC_TEMP :  -59.87 | VDDM : 1126.20 | AUX_INT :   -9.55 | CsaBias :   69.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45307e-03 / 2
  ADC_P0  : -9.55036e-03 ± 2.58155e-02
  ADC_P1  : 8.80801e-03 ± 6.57127e-04
  ADC_P2  : -6.72601e-06 ± 3.32637e-06
  CSA_Chi2/NDF : 1.71578e-04 / 2
  CSA_P0  : 5.99159e-02 ± 8.73682e-03
  CSA_P1  : 1.03368e-02 ± 6.58256e-04
  CSA_P2  : -5.57311e-05 ± 1.00245e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [21, 29, 65, 78, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [14, 31, 32, 48, 55, 68, 81, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1749', '1.800', '0.1616', '1.799', '0.0870', '7.000', '0.7068', 1, 1, 1, 1, 1724865430.0223196]
VI_after__Init : ['1.201', '0.1750', '1.800', '0.1616', '1.800', '0.0821', '7.000', '0.7066', 1, 1, 1, 1, 1724865438.2436767]
VI_at__the_End : ['1.201', '0.4823', '1.800', '0.1366', '1.800', '0.1118', '7.000', '0.7075', 1, 1, 1, 1, 1724865498.9120889]