TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_15_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-003-016-08 | FUSED_ID : 6359364768388624648
  IC_TEMP :  -56.48 | VDDM : 1127.55 | AUX_INT :   -6.91 | CsaBias :   70.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.11808e-04 / 2
  ADC_P0  : -6.90597e-03 ± 2.04205e-02
  ADC_P1  : 8.61653e-03 ± 5.15591e-04
  ADC_P2  : -6.42753e-06 ± 2.56787e-06
  CSA_Chi2/NDF : 1.16054e-04 / 2
  CSA_P0  : 5.77488e-02 ± 7.18543e-03
  CSA_P1  : 9.66973e-03 ± 5.41371e-04
  CSA_P2  : -4.60122e-05 ± 8.24443e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [5, 6, 8, 14, 58]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [3, 16, 58, 65, 72, 82, 87, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2545', '1.800', '0.1537', '1.800', '0.0875', '7.000', '0.7069', 1, 1, 1, 1, 1724865333.99878]
VI_after__Init : ['1.201', '0.2546', '1.800', '0.1538', '1.800', '0.0817', '7.000', '0.7069', 1, 1, 1, 1, 1724865342.7450542]
VI_at__the_End : ['1.201', '0.4806', '1.800', '0.1375', '1.800', '0.1110', '7.000', '0.7076', 1, 1, 1, 1, 1724865397.1899464]