TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_12_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-003-018-08 | FUSED_ID : 6359364768388624680
  IC_TEMP :  -65.13 | VDDM : 1144.93 | AUX_INT : -306.60 | CsaBias : -180.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.39688e-04 / 2
  ADC_P0  : -3.06600e-01 ± 2.58315e-02
  ADC_P1  : 1.28533e-02 ± 5.62962e-04
  ADC_P2  : -2.17353e-05 ± 2.42778e-06
  CSA_Chi2/NDF : 1.80285e-04 / 2
  CSA_P0  : 5.83044e-02 ± 8.95575e-03
  CSA_P1  : 1.02097e-02 ± 6.74751e-04
  CSA_P2  : -5.56818e-05 ± 1.02757e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [22, 70, 98, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [2, 5, 57, 61, 63, 100, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4438', '1.800', '0.1417', '1.800', '0.1016', '7.000', '0.7077', 1, 1, 1, 1, 1724865141.9926522]
VI_after__Init : ['1.201', '0.4448', '1.800', '0.1421', '1.800', '0.0939', '7.000', '0.7069', 1, 1, 1, 1, 1724865150.7319896]
VI_at__the_End : ['1.201', '0.4746', '1.800', '0.1338', '1.800', '0.1141', '7.000', '0.7074', 1, 1, 1, 1, 1724865213.2220976]