TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_10_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-003-019-08 | FUSED_ID : 6359364768388624696
  IC_TEMP :  -60.38 | VDDM : 1101.96 | AUX_INT :   -9.61 | CsaBias :   60.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42101e-03 / 2
  ADC_P0  : -9.60675e-03 ± 2.55375e-02
  ADC_P1  : 8.78097e-03 ± 6.52221e-04
  ADC_P2  : -6.36521e-06 ± 3.32082e-06
  CSA_Chi2/NDF : 1.72071e-04 / 2
  CSA_P0  : 6.00585e-02 ± 8.74936e-03
  CSA_P1  : 1.02795e-02 ± 6.59201e-04
  CSA_P2  : -5.48037e-05 ± 1.00389e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [6, 12, 83, 84, 109, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [8, 11, 86, 89, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3098', '1.800', '0.1485', '1.800', '0.0923', '7.000', '0.7070', 1, 1, 1, 1, 1724865046.333919]
VI_after__Init : ['1.201', '0.3098', '1.800', '0.1485', '1.800', '0.0875', '7.000', '0.7068', 1, 1, 1, 1, 1724865054.018331]
VI_at__the_End : ['1.201', '0.4864', '1.800', '0.1394', '1.799', '0.1139', '7.000', '0.7076', 1, 1, 1, 1, 1724865119.200303]