TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_07_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-003-021-08 | FUSED_ID : 6359364768388624728
  IC_TEMP :  -56.90 | VDDM : 1126.23 | AUX_INT :   -8.56 | CsaBias :   69.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14705e-03 / 2
  ADC_P0  : -8.56351e-03 ± 2.29186e-02
  ADC_P1  : 8.70917e-03 ± 5.81318e-04
  ADC_P2  : -6.41499e-06 ± 2.92855e-06
  CSA_Chi2/NDF : 2.74132e-04 / 2
  CSA_P0  : 5.80868e-02 ± 1.10434e-02
  CSA_P1  : 1.02063e-02 ± 8.32040e-04
  CSA_P2  : -5.56903e-05 ± 1.26710e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [63, 72, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [8, 13, 17, 36, 40, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2456', '1.800', '0.1200', '1.800', '0.0900', '7.000', '0.7069', 1, 1, 1, 1, 1724864853.76489]
VI_after__Init : ['1.201', '0.2456', '1.800', '0.1200', '1.800', '0.0847', '7.000', '0.7067', 1, 1, 1, 1, 1724864862.0541937]
VI_at__the_End : ['1.201', '0.4823', '1.800', '0.1366', '1.799', '0.1131', '7.000', '0.7077', 1, 1, 1, 1, 1724864929.9290326]