TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_05_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-003-022-08 | FUSED_ID : 6359364768388624744
  IC_TEMP :  -63.96 | VDDM : 1126.44 | AUX_INT :  -10.65 | CsaBias :   68.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73746e-03 / 2
  ADC_P0  : -1.06494e-02 ± 2.82695e-02
  ADC_P1  : 8.85364e-03 ± 7.27032e-04
  ADC_P2  : -6.30724e-06 ± 3.74169e-06
  CSA_Chi2/NDF : 1.82232e-04 / 2
  CSA_P0  : 5.82301e-02 ± 9.00398e-03
  CSA_P1  : 1.05058e-02 ± 6.78385e-04
  CSA_P2  : -5.76019e-05 ± 1.03310e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [60, 73, 98, 120]
 | N_BROKEN_SLOW :  [16]
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [1, 18, 26, 39, 51, 94, 101, 116, 126]
 | P_BROKEN_SLOW :  [16]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1395', '1.800', '0.1715', '1.799', '0.0904', '7.000', '0.7069', 1, 1, 1, 1, 1724864757.449287]
VI_after__Init : ['1.201', '0.1395', '1.800', '0.1714', '1.800', '0.0852', '7.000', '0.7067', 1, 1, 1, 1, 1724864765.4237697]
VI_at__the_End : ['1.201', '0.4855', '1.800', '0.1387', '1.800', '0.1150', '7.000', '0.7077', 1, 1, 1, 1, 1724864829.384832]