TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_34_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-004-008-07 | FUSED_ID : 6359364768388628615
  IC_TEMP :  -58.31 | VDDM : 1128.22 | AUX_INT :  -10.04 | CsaBias :   74.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63783e-03 / 2
  ADC_P0  : -1.00386e-02 ± 2.74304e-02
  ADC_P1  : 8.52414e-03 ± 6.75561e-04
  ADC_P2  : -6.23842e-06 ± 3.31274e-06
  CSA_Chi2/NDF : 1.48382e-04 / 2
  CSA_P0  : 5.78329e-02 ± 8.12480e-03
  CSA_P1  : 9.82378e-03 ± 6.12145e-04
  CSA_P2  : -4.88874e-05 ± 9.32225e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [4, 14, 39, 62, 64]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [6, 79, 101, 102, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2639', '1.800', '0.1290', '1.800', '0.0934', '7.000', '0.7075', 1, 1, 1, 1, 1724866486.8041618]
VI_after__Init : ['1.201', '0.2639', '1.800', '0.1290', '1.800', '0.0877', '7.000', '0.7075', 1, 1, 1, 1, 1724866494.916578]
VI_at__the_End : ['1.198', '0.4778', '1.800', '0.1400', '1.800', '0.1150', '7.000', '0.7085', 1, 1, 1, 1, 1724866545.5727048]