TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_37_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-004-010-07 | FUSED_ID : 6359364768388628647
  IC_TEMP :  -53.90 | VDDM : 1123.76 | AUX_INT :  -46.54 | CsaBias :   42.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.86029e-03 / 2
  ADC_P0  : -4.65350e-02 ± 3.14546e-02
  ADC_P1  : 9.02367e-03 ± 7.65262e-04
  ADC_P2  : -7.84796e-06 ± 3.68671e-06
  CSA_Chi2/NDF : 1.69992e-04 / 2
  CSA_P0  : 5.74819e-02 ± 8.69633e-03
  CSA_P1  : 1.00274e-02 ± 6.55206e-04
  CSA_P2  : -4.97641e-05 ± 9.97801e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [5, 16, 80, 102, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [52, 75, 83, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2021', '1.800', '0.1665', '1.799', '0.0953', '7.000', '0.7085', 1, 1, 1, 1, 1724866679.08234]
VI_after__Init : ['1.201', '0.2022', '1.800', '0.1666', '1.800', '0.0879', '7.000', '0.7076', 1, 1, 1, 1, 1724866687.2327492]
VI_at__the_End : ['1.201', '0.4874', '1.800', '0.1360', '1.804', '0.1131', '7.000', '0.7084', 1, 1, 1, 1, 1724866737.2929192]