TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_39_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-004-011-07 | FUSED_ID : 6359364768388628663
  IC_TEMP :  -59.93 | VDDM : 1125.19 | AUX_INT :   -9.03 | CsaBias :   67.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30099e-03 / 2
  ADC_P0  : -9.02504e-03 ± 2.44453e-02
  ADC_P1  : 8.56191e-03 ± 6.14636e-04
  ADC_P2  : -5.75618e-06 ± 3.07960e-06
  CSA_Chi2/NDF : 1.71359e-04 / 2
  CSA_P0  : 5.74891e-02 ± 8.73123e-03
  CSA_P1  : 1.02295e-02 ± 6.57835e-04
  CSA_P2  : -5.52548e-05 ± 1.00180e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [15, 56, 86, 107, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [36, 41, 57, 64, 95, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4326', '1.800', '0.1603', '1.799', '0.0964', '7.000', '0.7078', 1, 1, 1, 1, 1724866775.6859329]
VI_after__Init : ['1.201', '0.4334', '1.800', '0.1605', '1.801', '0.0908', '7.000', '0.7077', 1, 1, 1, 1, 1724866783.7994084]
VI_at__the_End : ['1.201', '0.4763', '1.800', '0.1338', '1.803', '0.1139', '7.000', '0.7083', 1, 1, 1, 1, 1724866845.8006003]