TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_42_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-004-013-07 | FUSED_ID : 6359364768388628695
  IC_TEMP :  -62.46 | VDDM : 1126.84 | AUX_INT :   -8.53 | CsaBias :   66.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17895e-03 / 2
  ADC_P0  : -8.52977e-03 ± 2.32052e-02
  ADC_P1  : 8.42886e-03 ± 5.60985e-04
  ADC_P2  : -6.58917e-06 ± 2.68303e-06
  CSA_Chi2/NDF : 1.78597e-04 / 2
  CSA_P0  : 5.67950e-02 ± 8.91373e-03
  CSA_P1  : 9.87092e-03 ± 6.71585e-04
  CSA_P2  : -5.06622e-05 ± 1.02275e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [39, 40, 87, 122, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [8, 11, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4252', '1.800', '0.1409', '1.799', '0.0966', '7.000', '0.7076', 1, 1, 1, 1, 1724866966.129282]
VI_after__Init : ['1.201', '0.4261', '1.800', '0.1411', '1.800', '0.0906', '7.000', '0.7075', 1, 1, 1, 1, 1724866974.8116305]
VI_at__the_End : ['1.201', '0.4730', '1.800', '0.1319', '1.801', '0.1149', '7.000', '0.7081', 1, 1, 1, 1, 1724867025.1508327]