TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_45_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-004-015-07 | FUSED_ID : 6359364768388628727
  IC_TEMP :  -49.65 | VDDM : 1125.15 | AUX_INT :  -10.68 | CsaBias :   72.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.97401e-03 / 2
  ADC_P0  : -1.06818e-02 ± 3.02108e-02
  ADC_P1  : 8.38265e-03 ± 7.46746e-04
  ADC_P2  : -5.09795e-06 ± 3.69799e-06
  CSA_Chi2/NDF : 1.35307e-04 / 2
  CSA_P0  : 5.97353e-02 ± 7.75857e-03
  CSA_P1  : 1.00623e-02 ± 5.84552e-04
  CSA_P2  : -4.98988e-05 ± 8.90204e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [49, 78, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [60, 61, 81, 100, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2201', '1.800', '0.1516', '1.799', '0.0842', '7.000', '0.7075', 1, 1, 1, 1, 1724867158.0346382]
VI_after__Init : ['1.201', '0.2202', '1.800', '0.1516', '1.800', '0.0786', '7.000', '0.7074', 1, 1, 1, 1, 1724867166.9519465]
VI_at__the_End : ['1.201', '0.4896', '1.800', '0.1370', '1.800', '0.1118', '7.000', '0.7079', 1, 1, 1, 1, 1724867217.2859662]