TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_49_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-004-017-00 | FUSED_ID : 6359364768388628752
  IC_TEMP :  -56.84 | VDDM : 1128.63 | AUX_INT :   -7.01 | CsaBias :   76.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.98645e-04 / 2
  ADC_P0  : -7.01181e-03 ± 2.03323e-02
  ADC_P1  : 8.38217e-03 ± 5.15204e-04
  ADC_P2  : -4.78986e-06 ± 2.59396e-06
  CSA_Chi2/NDF : 1.75477e-04 / 2
  CSA_P0  : 5.93043e-02 ± 8.83553e-03
  CSA_P1  : 1.01417e-02 ± 6.65693e-04
  CSA_P2  : -5.24231e-05 ± 1.01377e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [14, 95, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [15, 35, 39, 45, 56, 74, 81, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1665', '1.800', '0.1374', '1.800', '0.0908', '7.000', '0.7072', 1, 1, 1, 1, 1724867349.2748513]
VI_after__Init : ['1.201', '0.1665', '1.800', '0.1374', '1.800', '0.0852', '7.000', '0.7069', 1, 1, 1, 1, 1724867357.2662587]
VI_at__the_End : ['1.201', '0.4881', '1.800', '0.1391', '1.800', '0.1143', '7.000', '0.7079', 1, 1, 1, 1, 1724867419.2685661]