TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_50_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-004-018-00 | FUSED_ID : 6359364768388628768
  IC_TEMP :  -60.38 | VDDM : 1119.98 | AUX_INT :   -8.70 | CsaBias :   67.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15351e-03 / 2
  ADC_P0  : -8.70031e-03 ± 2.29754e-02
  ADC_P1  : 8.55220e-03 ± 5.70595e-04
  ADC_P2  : -6.25649e-06 ± 2.81568e-06
  CSA_Chi2/NDF : 1.65004e-04 / 2
  CSA_P0  : 5.97208e-02 ± 8.56780e-03
  CSA_P1  : 9.85088e-03 ± 6.45522e-04
  CSA_P2  : -4.96351e-05 ± 9.83053e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [29, 64, 88, 93, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [19, 90, 93, 103, 121, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2379', '1.800', '0.1535', '1.800', '0.0897', '7.000', '0.7072', 1, 1, 1, 1, 1724867445.5565102]
VI_after__Init : ['1.201', '0.2382', '1.800', '0.1536', '1.800', '0.0841', '7.000', '0.7072', 1, 1, 1, 1, 1724867454.4257503]
VI_at__the_End : ['1.201', '0.4798', '1.800', '0.1370', '1.800', '0.1146', '7.000', '0.7079', 1, 1, 1, 1, 1724867504.2459912]