TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_52_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-004-019-00 | FUSED_ID : 6359364768388628784
  IC_TEMP :  -60.75 | VDDM : 1128.76 | AUX_INT :   -8.08 | CsaBias :   60.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09428e-03 / 2
  ADC_P0  : -8.08220e-03 ± 2.24028e-02
  ADC_P1  : 8.66791e-03 ± 5.71453e-04
  ADC_P2  : -6.03627e-06 ± 2.89289e-06
  CSA_Chi2/NDF : 1.82525e-04 / 2
  CSA_P0  : 5.97320e-02 ± 9.01122e-03
  CSA_P1  : 1.04069e-02 ± 6.78930e-04
  CSA_P2  : -5.85017e-05 ± 1.03393e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [100, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [5, 49, 62, 80, 103, 105, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2665', '1.800', '0.1552', '1.800', '0.0900', '7.000', '0.7073', 1, 1, 1, 1, 1724867542.383081]
VI_after__Init : ['1.202', '0.2667', '1.800', '0.1553', '1.799', '0.0841', '7.000', '0.7069', 1, 1, 1, 1, 1724867550.4214578]
VI_at__the_End : ['1.201', '0.4805', '1.800', '0.1365', '1.800', '0.1151', '7.000', '0.7078', 1, 1, 1, 1, 1724867612.7856705]