TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_53_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-004-020-00 | FUSED_ID : 6359364768388628800
  IC_TEMP :  -68.68 | VDDM : 1123.77 | AUX_INT :   -8.80 | CsaBias :   63.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36100e-03 / 2
  ADC_P0  : -8.80240e-03 ± 2.50314e-02
  ADC_P1  : 9.07269e-03 ± 6.71940e-04
  ADC_P2  : -6.27275e-06 ± 3.59050e-06
  CSA_Chi2/NDF : 1.92309e-04 / 2
  CSA_P0  : 6.09508e-02 ± 9.24959e-03
  CSA_P1  : 1.07087e-02 ± 6.96890e-04
  CSA_P2  : -6.59400e-05 ± 1.06128e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [5, 12, 35, 47, 56, 72, 79, 91, 100, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [18, 46, 47, 49, 54, 70, 109, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2016', '1.800', '0.1332', '1.800', '0.0928', '7.000', '0.7081', 1, 1, 1, 1, 1724867638.0136743]
VI_after__Init : ['1.201', '0.2017', '1.800', '0.1332', '1.799', '0.0854', '7.000', '0.7069', 1, 1, 1, 1, 1724867646.2330816]
VI_at__the_End : ['1.196', '0.4699', '1.800', '0.1384', '1.800', '0.1166', '7.000', '0.7079', 1, 1, 1, 1, 1724867700.2489393]