TEST_NAME : Wafer
TEST_DATE : 24_08_28-19_58_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-004-023-00 | FUSED_ID : 6359364768388628848
  IC_TEMP :  -54.23 | VDDM : 1123.16 | AUX_INT :  -45.63 | CsaBias :   35.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.71347e-03 / 2
  ADC_P0  : -4.56250e-02 ± 3.03349e-02
  ADC_P1  : 9.07338e-03 ± 7.64224e-04
  ADC_P2  : -6.98492e-06 ± 3.81439e-06
  CSA_Chi2/NDF : 1.51309e-04 / 2
  CSA_P0  : 5.82599e-02 ± 8.20454e-03
  CSA_P1  : 1.00895e-02 ± 6.18153e-04
  CSA_P2  : -4.96262e-05 ± 9.41374e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [0, 19, 35, 66, 86, 103, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [2, 7, 17, 19, 83, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3029', '1.800', '0.1107', '1.800', '0.0856', '7.000', '0.7069', 1, 1, 1, 1, 1724867926.6296]
VI_after__Init : ['1.201', '0.3029', '1.800', '0.1106', '1.800', '0.0805', '7.000', '0.7069', 1, 1, 1, 1, 1724867934.6689763]
VI_at__the_End : ['1.201', '0.4920', '1.800', '0.1378', '1.800', '0.1114', '7.000', '0.7078', 1, 1, 1, 1, 1724867989.4128182]