TEST_NAME : Wafer
TEST_DATE : 24_08_28-20_32_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-005-005-10 | FUSED_ID : 6359364768388632666
  IC_TEMP :  -56.51 | VDDM : 1134.41 | AUX_INT :   -8.51 | CsaBias :   66.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.66537e-03 / 2
  ADC_P0  : -8.51000e-03 ± 2.77641e-02
  ADC_P1  : 8.40443e-03 ± 7.01314e-04
  ADC_P2  : -4.92502e-06 ± 3.52152e-06
  CSA_Chi2/NDF : 1.47425e-04 / 2
  CSA_P0  : 5.78164e-02 ± 8.09856e-03
  CSA_P1  : 9.99946e-03 ± 6.10168e-04
  CSA_P2  : -4.93839e-05 ± 9.29214e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [15, 22, 58, 63, 80, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [11, 78, 87, 117, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3421', '1.800', '0.1186', '1.800', '0.0870', '7.000', '0.7074', 1, 1, 1, 1, 1724869938.4459472]
VI_after__Init : ['1.201', '0.3422', '1.800', '0.1187', '1.800', '0.0811', '7.000', '0.7072', 1, 1, 1, 1, 1724869946.6852634]
VI_at__the_End : ['1.201', '0.4870', '1.800', '0.1392', '1.801', '0.1122', '7.000', '0.7081', 1, 1, 1, 1, 1724870001.6209724]