TEST_NAME : Wafer
TEST_DATE : 24_08_28-20_30_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-005-006-10 | FUSED_ID : 6359364768388632682
  IC_TEMP :  -55.66 | VDDM : 1134.66 | AUX_INT :   -6.91 | CsaBias :   68.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00786e-03 / 2
  ADC_P0  : -6.90983e-03 ± 2.15188e-02
  ADC_P1  : 8.43141e-03 ± 5.41544e-04
  ADC_P2  : -5.47310e-06 ± 2.69524e-06
  CSA_Chi2/NDF : 1.55765e-04 / 2
  CSA_P0  : 5.93415e-02 ± 8.32449e-03
  CSA_P1  : 9.92336e-03 ± 6.27190e-04
  CSA_P2  : -4.85797e-05 ± 9.55136e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [11, 12, 52, 78, 94, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [29, 37, 49, 77, 122, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2219', '1.800', '0.1277', '1.800', '0.0864', '7.000', '0.7076', 1, 1, 1, 1, 1724869842.0133615]
VI_after__Init : ['1.201', '0.2219', '1.800', '0.1276', '1.800', '0.0805', '7.000', '0.7074', 1, 1, 1, 1, 1724869850.9237008]
VI_at__the_End : ['1.201', '0.4849', '1.800', '0.1382', '1.800', '0.1131', '7.000', '0.7082', 1, 1, 1, 1, 1724869913.4868927]