TEST_NAME : Wafer
TEST_DATE : 24_08_28-20_27_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-005-008-10 | FUSED_ID : 6359364768388632714
  IC_TEMP :  -57.02 | VDDM : 1132.01 | AUX_INT :   -7.11 | CsaBias :   60.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.70114e-04 / 2
  ADC_P0  : -7.10815e-03 ± 1.99481e-02
  ADC_P1  : 8.44064e-03 ± 4.94822e-04
  ADC_P2  : -5.93919e-06 ± 2.42821e-06
  CSA_Chi2/NDF : 1.54032e-04 / 2
  CSA_P0  : 6.11254e-02 ± 8.27805e-03
  CSA_P1  : 9.90998e-03 ± 6.23692e-04
  CSA_P2  : -4.93995e-05 ± 9.49808e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [13, 29, 40, 70, 89, 91, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [32, 37, 88, 99, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3663', '1.800', '0.1592', '1.799', '0.1002', '7.000', '0.7076', 1, 1, 1, 1, 1724869649.5182323]
VI_after__Init : ['1.201', '0.3666', '1.800', '0.1593', '1.800', '0.0945', '7.000', '0.7078', 1, 1, 1, 1, 1724869658.4155]
VI_at__the_End : ['1.201', '0.4850', '1.800', '0.1369', '1.800', '0.1137', '7.000', '0.7083', 1, 1, 1, 1, 1724869712.6932817]