TEST_NAME : Wafer
TEST_DATE : 24_08_28-20_25_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x5 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-005-009-10 | FUSED_ID : 6359364768388632730
  IC_TEMP :  -56.31 | VDDM : 1135.14 | AUX_INT : -165.88 | CsaBias :  -59.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18551e-03 / 2
  ADC_P0  : -1.65880e-01 ± 3.09961e-02
  ADC_P1  : 1.07373e-02 ± 7.08357e-04
  ADC_P2  : -1.43288e-05 ± 3.18525e-06
  CSA_Chi2/NDF : 1.27992e-04 / 2
  CSA_P0  : 5.79790e-02 ± 7.54596e-03
  CSA_P1  : 9.85685e-03 ± 5.68534e-04
  CSA_P2  : -4.81709e-05 ± 8.65809e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [6, 27, 59, 79, 96, 98, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [21, 45, 57, 63, 69, 72]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2736', '1.800', '0.1424', '1.800', '0.0900', '7.000', '0.7079', 1, 1, 1, 1, 1724869553.4925797]
VI_after__Init : ['1.201', '0.2737', '1.800', '0.1424', '1.800', '0.0843', '7.000', '0.7076', 1, 1, 1, 1, 1724869562.2489352]
VI_at__the_End : ['1.201', '0.4848', '1.800', '0.1340', '1.800', '0.1139', '7.000', '0.7085', 1, 1, 1, 1, 1724869623.7530904]