TEST_NAME : Wafer
TEST_DATE : 24_08_28-20_19_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-005-013-10 | FUSED_ID : 6359364768388632794
  IC_TEMP :  -55.29 | VDDM : 1129.26 | AUX_INT :   -7.27 | CsaBias :   64.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.65129e-04 / 2
  ADC_P0  : -7.27127e-03 ± 2.10358e-02
  ADC_P1  : 7.99710e-03 ± 4.97863e-04
  ADC_P2  : -5.08775e-06 ± 2.33356e-06
  CSA_Chi2/NDF : 1.18675e-04 / 2
  CSA_P0  : 5.81381e-02 ± 7.26610e-03
  CSA_P1  : 9.62578e-03 ± 5.47448e-04
  CSA_P2  : -4.51065e-05 ± 8.33698e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [1, 17, 50, 64, 120, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [16, 18, 29, 54, 81, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4153', '1.800', '0.1464', '1.799', '0.0941', '7.000', '0.7074', 1, 1, 1, 1, 1724869174.9646537]
VI_after__Init : ['1.201', '0.4156', '1.800', '0.1464', '1.800', '0.0882', '7.000', '0.7076', 1, 1, 1, 1, 1724869183.2110884]
VI_at__the_End : ['1.201', '0.4815', '1.800', '0.1354', '1.800', '0.1127', '7.000', '0.7084', 1, 1, 1, 1, 1724869245.2302475]